IC Counterfeit Test
Date：2021-09-15 14:32:23Views：186Author：CHUANGXIN ONLINE TESTING LAB
Device Description:
This section provides designers with the data sheet specifications for MAX® II devices. The chapters contain feature definitions of the internal architecture, Joint Test Action Group (JTAG) and in-system programmability (ISP) information, DC operating conditions, AC timing parameters, and ordering information for MAX II devices.
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